- List
- EU dual-use list – Annex I to Regulation (EU) 2021/821, updated annually
Entries in this group
- 3B001 Equipment for the manufacturing of semiconductor devices or materials, as follows and specially designed components and accessories therefor:
- 3B002 Test equipment specially designed for testing finished or unfinished semiconductor devices as follows and specially designed components and accessories…
- 3B501 Equipment for the manufacturing of semiconductor devices or materials, as follows and specially designed components and accessories therefor:
- 3B503 Scanning Electron Microscope (SEM) equipment designed for imaging semiconductor devices or integrated circuits, having all of the following:
- 3B504 Cryogenic wafer probing equipment, having all of the following: