1.B.3.Dimensional inspection machines, instruments, or systems, as follows:

a. Computer controlled or numerically controlled coordinate measuring machines (CMM) having either of the following characteristics:
1. Having only two axes and having a maximum permissible error of length measurement along any axis (one dimensional), identified as any combination of E0x MPE, E0y MPE or E0z MPE, equal to or less (better) than (1.25 + L/1000) μm (where L is the measured length in mm) at any point within the operating range of the machine (i.e., within the length of the axis), according to ISO 10360-2(2009); or
2. Three or more axes and having a three dimensional (volumetric) maximum permissible error of length measurement (E0, MPE equal to or less (better) than (1.7 + L/800) µm (where L is the measured length in mm) at any point within the operating range of the machine (i.e., within the length of the axis), according to ISO 10360-2(2009).
Technical Note: The E0, MPE of the most accurate configuration of the CMM specified according to ISO 10360-2(2009) by the manufacturer (e.g., best of the following: probe, stylus length, motion parameters, environment) and with all compensations available shall be compared to the 1.7 + L/800 µm threshold.
b. Linear displacement measuring instruments, as follows:
1. Non-contact type measuring systems with a “resolution” equal to or better (less) than
0.2 µm within a measuring range up to 0.2 mm;
2. Linear variable differential transformer (LVDT) systems having both of the following characteristics:
a. 1. “Linearity” equal to or less (better) than 0.1% measured from 0 to the full operating range, for LVDTs with an operating range up to 5 mm; or
2. “Linearity” equal to or less (better) than 0.1% measured from 0 to 5 mm for LVDTs with an operating range greater than 5 mm; and
b. Drift equal to or better (less) than 0.1% per day at a standard ambient test room temperature ± 1 K (± 1 ºC);
3. Measuring systems having both of the following characteristics:
a. Containing a laser; and
b. Capable of maintaining for at least 12 h, over a temperature range of ± 1 K (-± 1 ºC) around a standard temperature and a standard pressure:
1. A “resolution” over their full scale of 0.1 µm or better; and
2. With a “measurement uncertainty” equal to or better (less) than
(0.2 + L/2000) µm (L is the measured length in mm);
Note: Item 1.B.3.b.3. does not control measuring interferometer systems, without closed or open loop feedback, containing a laser to measure slide movement errors of machine tools, dimensional inspection machines, or similar equipment.
Technical Note: In Item 1.B.3.b. ‘linear displacement’ means the change of distance between the measuring probe and the measured object.
c. Angular displacement measuring instruments having an “angular position deviation” equal to or better (less) than 0.00025°;
Note: Item 1.B.3.c. does not control optical instruments, such as autocollimators, using collimated light (e.g., laser light) to detect angular displacement of a mirror.
d. Systems for simultaneous linear-angular inspection of hemishells, having both of the following characteristics:
1. “Measurement uncertainty” along any linear axis equal to or better (less) than 3.5 µm per 5 mm; and
2. “Angular position deviation” equal to or less than 0.02°.
Notes: 1. Item 1.B.3. includes machine tools, other than those specified by 1.B.2, that can be used as measuring machines if they meet or exceed the criteria specified for the measuring machine function.
2. Machines described in Item 1.B.3. are controlled if they exceed the threshold specified anywhere within their operating range.
Technical Note: All parameters of measurement values in this item represent plus/minus, i.e., not total band.